Reliable Edge Intelligence in Unreliable Environment
Published in Design, Automation & Test in Europe Conference & Exhibition (DATE), 2021, pp. 896-901, 2021
This paper tackles the pressing issue of maintaining reliable computational intelligence at the edge of the network, despite challenges such as intermittent connectivity and limited resources. It offers a comprehensive analysis and proposes innovative solutions that pave the way for resilient edge computing architectures.
Recommended citation: M. Lee, X. She, B. Chakraborty, S. Dash, B. Mudassar, S. Mukhopadhyay. (2021). "Reliable Edge Intelligence in Unreliable Environment." Design, Automation & Test in Europe Conference & Exhibition (DATE), 2021, pp. 896-901. https://ieeexplore.ieee.org/document/9474097